Characterization of nanomaterials

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Icp-aes analysis of nanoparticles

0.1 What is icp-aes?

0.2 How does icp-aes work?

0.3 Icp-aes of nanoparticles to determine elemental composition

0.4 Calculations for icp concentrations

0.5 Icp-aes at work

0.6 Determining analyte concentration

0.7 Calculating concentration in ppm

0.8 Determining concentration of original solution

0.9 Calculating stoichiometric ratio

0.10 Determining concentration of nanoparticles in solution

0.11 Combined surface area

0.12 Bibliography

1 Tga/dsc-ftir characterization of oxide nanaoparticles

1.1 Metal oxide nanoparticles

1.2 Synthesis of metal oxide nanoparticles

1.3 Metal oxide nanoparticles synthesized via slow decomposition

1.4 Synthesis and characterization of wo 3-x Nanorods

1.5 Thermogravimetric analysis (tga)/differential scanning calorimetry (dsc

1.6 Fourier transform infrared spectroscopy

1.7 Tga/dsc–ftir characterization

1.8 Bibliography

2 Thermogravimetric analysis of single walled carbon nanotubes

2.1 An overview of thermogravimetric analysis

2.2 Determination of the mass of iron catalyst impurity in hipco swnts.

2.3 Determining the number of functional groups on swnts

2.4 Determination of the mass of a chemical absorbed by functionalized swnts

2.5 Bibliography

3 Bet surface area analysis of nanoparticles

4 Measuring the specific surface area of nanoparticle suspensions using

4.1 Introduction

4.2 Overview of nmr

4.3 Advantages of nmr over bet technique

4.4 How does nmr work?

4.5 Polarization

4.6 T 1 Relaxation

4.7 T 2 Relaxation

4.8 Cpmg sequence

4.9 Nmr relaxation mechanism in solid suspensions

4.10 Calculations

4.11 Sample preparation and experimental setup

4.12 Nmr analysis

4.13 Limitations of the t 2 Technique

4.14 Example of usage

4.15 Bibliography

5 Dynamic light scattering

5.1 Introduction

5.3 Experimental

5.4 Instrument of dls

5.5 Sample preparation

5.6 Measurement

5.7 Data analysis

5.8 Cumulant method

5.9 Three index of size distribution

5.10 An example of an application

5.11 Comparison with tem and afm

5.12 Conclusion

5.13 Bibliography

6 Determining the chemical formula of nonstoichiometric iron oxide

7 Xafs analysis for arsenic adsorption onto iron oxides

8 Nanoparticle deposition studies using a quartz crystal microbalance

8.2 Experimental planning

8.3 Surface election

8.4 Sensor cleaning

8.5 Sample preparation

8.6 Instrument preparation

8.7 Data acquisition

8.8 Instrument clean-up

8.9 Data modeling

8.10 Bibliography

Optical properties of group 12-16 (ii-vi) semiconductor nanoparticles

0.1 What are group 12-16 semiconductors?

0.2 What are group 12-16 (ii-vi) semiconductor nanoparticles?

0.3 Optical properties of semiconductor quantum nanoparticles

0.4 Energy levels in a semiconductor

0.5 Energy level

0.7 Valence band

0.8 Conduction band

0.9 Exciton and exciton bohr radius

0.10 Energy levels in a quantum dot semiconductor

0.11 Quantum confinement

0.12 Discrete energy levels

0.13 Tunable band gap

0.14 Uv-visible absorbance

0.15 Fluorescence

0.16 Factors affecting the optical properties of nps

0.17 Applications of the optical properties of group 12-16 semiconductor nps

0.18 Bibliography

1 Band gap measurement

2 Band gap measurements of quantum dots

3 Using uv-vis for the detection and characterization of silicon quantum

4 Characterization of group 12-16 (ii-vi) semiconductor nanoparticles by

5 Characterization of covalently functionalized single-walled carbon

6 Characterization of single-walled carbon nanotubes by raman spectroscopy

7 Characterization of graphene by raman spectroscopy

8 Attenuated total reflectance-fourier transform infrared spectroscopy

8.1 Introduction

8.2 Total internal reflection

8.3 Experimental conditions

8.4 Refractive indices of atr crystal and sample

8.5 Single and multiple reflection crystals

8.6 Angle of incidence

8.7 Atr crystal shape

8.8 Crystal-sample contact

8.9 Wavelength dependency

8.10 Selecting an atr crystal

8.11 Sample versatility

8.14 Sample preparation

8.15 Application to inorganic chemistry

8.16 Bibliography

9 Optical characterization of group 12-16 (ii-vi) semiconductor nanoparticles

9.1 Fluorescence spectroscopy

9.2 Difference between fluorescence and phosphorescence

9.3 Instrumentation

9.4 The light source

9.5 The diffraction grating and primary filter

9.6 Sample cell and sample preparation

9.7 Secondary filter

9.10 Analysis of data

9.11 Quantitative information

9.12 Qualitative information

9.13 Fluorescence spectra of different group 12-16 semiconductor nanoparticles

9.14 Cadmium selenide

9.15 Cadmium telluride

9.16 Adding shells to qds

9.17 Bibliography

10 Xps of carbon nanomaterials

10.1 Introduction

10.2 Basics of xps

10.3 Sample preparation

10.4 Experimental set-up

10.5 Measurement specifications

10.6 Data collection

10.7 Limitations

10.8 Xps for carbon nanomaterials

10.9 Sample preparation

10.10 Analysis and applications for carbon nanomaterials

10.11 Chemical speciation

10.12 Bonding and functional groups

10.13 Further characterization

10.14 Hybridization

10.15 Reaction completion

10.16 Nature and extent of functionalization

10.17 Conclusion

10.18 Bibliography

11 Using xps to analyze metal nanoparticles

12 Mossbauer analysis of iron oxide nanoparticles

13 Using 13-c nmr to study carbon nanomaterials

Beyond optical microscopy

1 Tem imaging of carbon nanomaterials

2 Transmission electron microscopy image for multilayer-nanomaterials

3 Atomic force microscopy

4 Scanning tunneling microscopy of nanomaterials

4.1 Introduction

4.2 Principles of scanning tunneling microscopy

4.3 Comparison of atomic force microscopy (afm) and scanning tunneling

4.4 Applications of scanning tunneling microscopy in nanoscience.

4.5 Bibliography

5 Rolling molecules on surfaces under stm imaging

6 The application of vsi (vertical scanning interferometry) to the study

Source: OpenStax, Nanomaterials and nanotechnology. OpenStax CNX. May 07, 2014 Download for free at http://legacy.cnx.org/content/col10700/1.13

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